Lab1_Casimir – Equipment Specifications

This document lists the hardware and instrumentation used in the Casimir effect experiment. All specs must be version-controlled and updated with each modification.

🧲 Conductive Plates#

• Material: Gold-coated silicon wafers
• Diameter: 25 mm
• Surface roughness: < 1 nm RMS

⚙️ Piezo Actuator#

• Model: PI P-753.21C
• Travel range: 10 µm
• Resolution: 0.1 nm
• Control: Closed-loop with capacitive sensor

🔬 Laser Interferometer#

• Model: SIOS SP 5000
• Wavelength: 632.8 nm (HeNe)
• Resolution: 0.01 nm
• Sampling rate: 10 kHz

🌡️ Environmental Controls#

• Temperature: 22 ± 0.5 °C
• Humidity: 45 ± 5%
• Vacuum chamber: Optional (10⁻³ Torr baseline)

🧠 Notes#

• All equipment must be recalibrated before each run.
• Changes in hardware must be logged in calibration_log.md.
• Resonance artifacts due to mechanical drift should be annotated in data logs.